• Superior TRIFT Analyzer Performance
• HR²
• Parallel Imaging MS/MS – NEW!
• Cluster Source Ion Guns
• FIB-TOF 3D Chemical Imaging
• Features & Accessories

Superior TRIFT Analyzer Performance

Uniform imaging sensitivity on curved or rough surfaces due to the large solid angle of collection Superior depth-of-field for high mass resolution images due to large energy acceptance window Low spectral background and highest abundance sensitivity due to the ability to reject metastable ions High mass sensitivity for organic and medical applications Turnkey insulator analysis enabled by patented dual beam charge compensation technology MS/MS ready spectrometer for unambiguous peak identification

HR²

High spatial resolution with high mass resolution

HR² imaging is demonstrated below in the images of micro-organic droplets. In a single analysis, peaks for multiple molecular fragments were observed in the spectrum at m/z 57 with high mass resolution and identified by measurement of their exact mass. The distribution of each species was visualized with a spatial resolution of less than 400 nm. The single measurement that contains all this information was acquired in only six minutes due to the high ion beam current available in the nanoTOF’s HR² imaging mode.

Parallel Imaging MS/MS – NEW!

Due to the limitations of TOF-SIMS in mass accuracy and mass resolution, high mass peaks often go unidentified in traditional TOF-SIMS experiments.  PHI’s new revolutionary Parallel Imaging MS/MS option eliminates this limitation.  In the MS/MS mode, a precursor ion of choice (1 Dalton wide nanoisotopic acceptance window) is selected from the secondary ion stream and deflected into a high energy collision induced dissociation (CID) cell while the rest of the secondary ions are collected as usual (MS¹ data).   In the CID cell, the precursor ions collide with argon gas causing fragmentation.  The resulting fragment ions are mass separated in a linear TOF and counted at a second pulse counting detector, producing an MS/MS spectrum (MS²).   Similar to the MS¹ data, a full spectrum is collected for each image pixel in the MS/MS experiment.  Thus, the MS/MS tand traditional TOF-SIMS data are collected simultaneously from the same analytical area in a single experiment.  The imaging speed of both MS¹ and MS² data is based on a pulsed ion beam operated at >8 kHz.

The resulting MS/MS fragmentation spectrum is used to positively identify the composition of the precursor ion by identification of the fragmented ions and/or comparison to mass spectral databases.  Operating the TOF-SIMS in the MS/MS mode can also improve the sensitivity for species in which the peak of interest has mass interferences with other compounds.  By detection of a unique fragment ion originating from the species of interest, the limit of detection can be greatly improved.

Heat treated PET sample.  Composition assignments for the MS² spec.  trum obtained from CID fragmentation of the +mass 577 precursor ion confirm that the observed crystals are composed of ethylene terephthalate trimer

Automotive polymer sample.   MS/MS image (MS²) of the +m/z 481 precursor ion showing a non-uniform distribution of the species on the sample surface.

MS/MS spectrum (MS²) obtained from CID fragmentation of the +m/z 481 precursor ion.  Identification of the fragment ions indicates that the precursor ion [M+H]⁺ is Tinuvin 770, a polymer additive.

Further confirmation of the identity of the precursor ion is made with a positive match to Tinuvin 770 in a commercially available MS/MS database which is included with the MS/MS option.  The spectrum in red is the MS² spectrum and the blue spectrum is the acquired reference database spectrum of Tinuvin.

Cluster Source Ion Guns

Multiple cluster source ion gun options

Fig A: 20 kV Ar2500+ gas cluster ion beam   Fig B: 20 kV C60 ion gun

20 kV Ar2500+ gas cluster ion beam for molecular depth profiling organic films. Shown in Fig. A is a depth profile of a multi-layer polystyrene and poly (2-vinylpyridine) block copolymer film obtained by sputtering with a 5 kV Ar2500+ gas cluster ion beam.                         20 kV C60 ion gun provides imaging and spectroscopy when the highest sensitivity for organic species is required. Shown in Fig. B is the detection and imaging of specific lipids in a mouse brain specimen.

FIB-TOF 3D Chemical Imaging

SED Image of FIB Cut

Overlay of Sr+, Ce+, Zr+ 3D Images

TOF-SIMS imaging of FIB sectioned specimens High mass resolution spectra at every pixel 3D imaging software with multi-element overlay capability

Features & Accessories