AVS 65 Lunch n Learn Complementary XPS TOF-SIMS

AVS 65 Lunch n Learn – Complementary XPS & TOF-SIMS

Posted on by Serge Dandache

AVS 65 Lunch n Learn Complementary XPS TOF-SIMS

Physical Electronics User Reception

AVS 65 – Long Beach, CA

Physical Electronics would like to cordially invite you to join us on
Monday, October 22, 2018 from 8:30-10:30pm at the Hyatt Regency Long Beach in the Beacon Ballroom (Sec. A) for appetizers and drinks
for our annual PHI User Reception. 
WHEN: Monday, October 22, 2018, 8:30-10:30pm(Immediately following Welcome Mixer)
WHERE: Hyatt Regency Long Beach – Beacon Ballroom (Sec. A)
Drinks and Appetizers will be provided.
Please RSVP for the reception by emailing Ben Ellefson 
at  Bellefson@phi.com  by October 19 if you’ll be able to attend. 

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

We look forward to seeing you there!