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Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis. View Discounted Products
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AVS 65 Lunch n Learn Complementary XPS TOF-SIMS
For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful. XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface. This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.
We look forward to seeing you there!
Getting “Moore” By Using “Haf”
Hafnium oxide helps keep microelectronics on the Moore’s law trajectory |
AFM vs. STM: The Resolution Battle The uneasy truce has been broken, as AFM refuses to concede resolution superiority to STM. |
Springtime Beauty at the Nanoscale Just like the brilliant blooms each spring, STM provides a captivating view of the world in which we live. |
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What’s Cypher’s High Resolution Secret? You’ve seen Cypher’s high-resolution results, but what makes it possible? Roger Proksch shares the key secret to Cypher’s performance. |
Cypher is a Terrible Earthquake Detector! A man, a dog, and an AFM were sitting in a lab when an earthquake hit. The AFM is the only one that wasn’t startled! |
Springtime Beauty at the Nanoscale Just like the brilliant blooms each spring, STM provides a captivating view of the world in which we live.
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Herzan is excited to announce it’s Summer Savings Program! This program allows researchers to save big on Herzan’s most popular products (up to 30%), including the TS Series active vibration isolation tables, WaveCatcher site survey tools, and AEK-2002 acoustic enclosures.
July 24, 2018 (Santa Barbara, CA) Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements. The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale magnetic domain structure. The VFM4 is capable of applying either an adjustable in-plane (±8000 G ) or out-of-plane (±1200 G) magnetic field to a sample and offers ~1 G field resolution. Researchers can learn more about the VFM4 and see recent results at http://afm.oxinst.com/VFM4.
“This new combination of capabilities has allowed one customer at a national synchrotron facility to use AFM for research that was previously only possible with very costly and time-consuming scanning x-ray transmission microscopy (SXTM),” said Dr. Maarten Rutgers, Director of New Product Introduction. “No other AFM commercial solution offers the same capabilities, versatility, and ease of use for magnetics research. While the VFM has traditionally been used for magnetic force microscopy experiments, it can also be used with techniques like conductive AFM (CAFM) and on a wide range of diverse samples including piezoelectric and ferroelectric materials.”
The VFM4 easily attaches to most Asylum Research MFP-3D AFMs and includes replaceable pole tips to quickly adapt between in-plane and out-of-plane configurations. It maintains a steady magnetic field with rare-earth magnets that produce no heat, thermal drift, or mechanical vibration. For experiments where both an applied magnetic field and a high tip-sample voltage bias are required, there is an optional high-voltage kit to adapt the VFM4 for safe application of voltages up to ±220 Volts.
Image caption: Magnetic skyrmions in Co-based thin film pads imaged with MFM under out-of-plane magnetic fields. Image courtesy of K. Bouzehouane, Unité Mixte de Physique CNRS, Thales, Univ. Paris-Sud, Université Paris-Saclay France.
About Oxford Instruments Asylum Research
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets. Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.
About Oxford Instruments plc
Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.
This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.
Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.
For further information please Contact Us
September 13, 2018
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Dr. Rajiv Giridharagopal, Ginger Lab, University of Washington–Seattle Rajiv Giridharagopal has been a Senior Research Scientist in Prof. David Ginger’s laboratory at the University of Washington–Seattle since 2015, with a research focus on SPM development for photovoltaic, bioelectronic, and related materials. He previously worked at the Intel Corporation in optical microscopy development. He earned a Ph.D. in Electrical Engineering from Rice University and holds two patents. |
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Dr. F. Ted Limpoco, Oxford Instruments Asylum Research Ted Limpoco is an Applications Scientist at Oxford Instruments. He has over 10 years of AFM experience in nanoelectrical, nanomechanical, and nanotribology techniques. He was previously a postdoctoral fellow at the University of Illinois at Urbana-Champaign and has a Ph.D. in chemistry from the University of Florida. |
We at Herzan are excited to meet with researchers at the Microscopy & Microanalysis Meeting in the Baltimore Convention Center in Baltimore, Maryland. We will be sharing our latest innovations in the field of environmental control, designed specifically to address needs within the microscopy community. Stop by Booth 1206 to learn more about the unprecedented vibration isolation performance of the AVI Series and discover how you can save money and time installing an instrument by utilizing the WaveCatcher site survey tool. Also, there will be some free giveaways at the booth to bring home to family and friends and share with colleagues in the lab!
WHAT: Discover Herzan’s Innovations for Environmental Control Popular ApplicationsHerzan’s environmental solutions support a wide range of research applications relevant to M&M attendees, including: |
Modern Rheometer: Enhance workflow efficiency with the latest generation Thermo Scientific™ HAAKE™ Viscotester™ iQ rheometer, designed to meet daily requirements of QC labs. This reliable QC rheometer sets new standards in modularity, ease of use, increased efficiency and intelligent user guidance, from simple viscosity determinations to complex rheological investigations.
20% Savings: Trade-in your old rheometer and take advantage of up-front savings to get a new HAAKE Viscotester iQ system into your lab. Eligible trade-in rheometers include the Thermo Scientific™ Viscotester™ 550 or an equivalent rheometer from any manufacturer. The 20% savings offer is valid for purchases before December 31, 2018, and it extends to a temperature control module and standard measuring geometries purchased along with the rheometer.
Effective October 1, 2018, Paul Greenwood will be retiring as President of Spectra Research Corporation (SRC). Paul started his career with parent company Alan Crawford Associates in 1982 and has been with SRC since 1993. With SRC, Paul has been responsible for the management of the company as it evolved from a supplier of lasers and optics, to a cross-Canada distributor representing over 15 different companies providing technology for surface science, spectroscopy and materials characterization. We wish Paul well in his retirement.
Serge Dandache will take over as Sales Manager for SRC. Serge, based in Montreal, has been with SRC for 4 years and will maintain his responsibility for direct sales of SRC products in Ottawa, Eastern Ontario, Quebec and Eastern Canada.
Lisa McDonald joins SRC as Account Manager for Central and Western Canada, based out of Toronto. Lisa has many years of experience in instrumentation and chemical distribution including having previously worked with SRC from 2000-2009 as Account Manager.
Contact information for Paul, Lisa and Serge is below. SRC looks forward to helping you with your research instrumentation needs now, and in the future.
Paul Greenwood paulgreenwood@rogers.com |
Lisa McDonald lisam@aca.ca Tel: 905-502-2031 |
Serge Dandache serged@aca.ca Tel: 514-908-9786 |
About Herzan
Herzan’s mission is to provide carefully articulated environmental solutions for precision research instruments in the fields of Atomic Force Microscopy and Vibration and Acoustic Isolation. The company’s product line encompasses all forms of environmental isolation systems for advanced microscopes and other imaging and analytical instrumentation. They specialize in supporting nanotechnology research but also offer solutions for product testing, in-vitro fertilization and many other applications.
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McGill University AFM Summer School and Workshop Topics Increase Your AFM Knowledge • Video-Rate AFM with the Asylum Research Cypher VRS Hands-on demonstration labs will complement the lectures. It’s an excellent opportunity to get tips and tricks on AFM operation, and to see video-rate AFM in action. Speakers Registration Serge Dandache Spectra Research Corporation Phone 905-890-0555 Toll Free : 1-866-753-4433 |