AVS 65 Lunch n Learn Complementary XPS TOF-SIMS

Physical Electronics User Reception

AVS 65 – Long Beach, CA

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

We look forward to seeing you there!

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July 24, 2018 (Santa Barbara, CA) Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements.  The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale magnetic domain structure. The VFM4 is capable of applying either an adjustable in-plane (±8000 G ) or out-of-plane (±1200 G) magnetic field to a sample and offers ~1 G field resolution. Researchers can learn more about the VFM4 and see recent results at http://afm.oxinst.com/VFM4.

“This new combination of capabilities has allowed one customer at a national synchrotron facility to use AFM for research that was previously only possible with very costly and time-consuming scanning x-ray transmission microscopy (SXTM),” said Dr. Maarten Rutgers, Director of New Product Introduction. “No other AFM commercial solution offers the same capabilities, versatility, and ease of use for magnetics research. While the VFM has traditionally been used for magnetic force microscopy experiments, it can also be used with techniques like conductive AFM (CAFM) and on a wide range of diverse samples including piezoelectric and ferroelectric materials.”

The VFM4 easily attaches to most Asylum Research MFP-3D AFMs and includes replaceable pole tips to quickly adapt between in-plane and out-of-plane configurations. It maintains a steady magnetic field with rare-earth magnets that produce no heat, thermal drift, or mechanical vibration. For experiments where both an applied magnetic field and a high tip-sample voltage bias are required, there is an optional high-voltage kit to adapt the VFM4 for safe application of voltages up to ±220 Volts.

Image caption:  Magnetic skyrmions in Co-based thin film pads imaged with MFM under out-of-plane magnetic fields. Image courtesy of K. Bouzehouane, Unité Mixte de Physique CNRS, Thales, Univ. Paris-Sud, Université Paris-Saclay France.

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About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.  Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets.  Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc 

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For further information please Contact Us

September 13, 2018 11:30am-12:30pm EDT  (3:30-4:30pm UTC) This free webinar, held in conjunction with the Materials Research Society (MRS), provides an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. • Discover the latest AFM techniques to accurately map local photocurrent, work function, and other electrical response in photoactive materials and charge transport layers • See real-world results from leading researchers in the field on a variety of photovoltaic systems using standard and advanced AFM techniques • Learn how AFM has become simpler with turnkey instrumentation for better AFM optical experim Presenters Dr. Rajiv Giridharagopal, Ginger Lab, University of Washington–Seattle Rajiv Giridharagopal has been a Senior Research Scientist in Prof. David Ginger’s laboratory at the University of Washington–Seattle since 2015, with a research focus on SPM development for photovoltaic, bioelectronic, and related materials. He previously worked at the Intel Corporation in optical microscopy development. He earned a Ph.D. in Electrical Engineering from Rice University and holds two patents. Dr. F. Ted Limpoco, Oxford Instruments Asylum Research Ted Limpoco is an Applications Scientist at Oxford Instruments. He has over 10 years of AFM experience in nanoelectrical, nanomechanical, and nanotribology techniques. He was previously a postdoctoral fellow at the University of Illinois at Urbana-Champaign and has a Ph.D. in chemistry from the University of Florida.

Webinar Archives Cypher VRS Video-Rate AFM Graphene and 2D Materials Choosing the Best AFM Probe Analysis of Thin Films Characterization of Polymers Advanced PFM Introduction to PFM Cypher AFM blueDrive Photothermal Excitation Nanomechanical Mapping with Contact Resonance Getting Started with AFM and Biology Nanomechanical Mapping with AM-FM Mode Ultra-High Resolution Imaging wih Cypher AFMs Who Should Attend Academic and industrial researchers including: • Materials scientists, chemists, physicists, and electrical and chemical engineers involved in photovoltaic R&D • Scientists and engineers using microscopy, especially atomic force and scanning probe microscopy • Managers and instructors of multi-user characterization, microscopy, or nanotechnology centers

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Effective October 1, 2018, Paul Greenwood will be retiring as President of Spectra Research Corporation (SRC). Paul started his career with parent company Alan Crawford Associates in 1982 and has been with SRC since 1993. With SRC, Paul has been responsible for the management of the company as it evolved from a supplier of lasers and optics, to a cross-Canada distributor representing over 15 different companies providing technology for surface science, spectroscopy and materials characterization. We wish Paul well in his retirement.

Serge Dandache will take over as Sales Manager for SRC. Serge, based in Montreal, has been with SRC for 4 years and will maintain his responsibility for direct sales of SRC products in Ottawa, Eastern Ontario, Quebec and Eastern Canada.

Lisa McDonald joins SRC as Account Manager for Central and Western Canada, based out of Toronto. Lisa has many years of experience in instrumentation and chemical distribution including having previously worked with SRC from 2000-2009 as Account Manager.

Contact information for Paul, Lisa and Serge is below. SRC looks forward to helping you with your research instrumentation needs now, and in the future.