Optical tensiometer; Smart interfacial measurement solutions for wettability and adhesion

The new generation Theta Optical Tensiometer (Attension^® Theta Flex) from Biolin Scientific  is a contact angle meter that enables all measurements in one instrument for both research and quality control. It measures static and dynamic contact angle, 3D surface roughness, surface free energy, surface and interfacial tension, and interfacial rheology.

One instrument for all your measurement needs

All the measurements are readily included in the software. Thanks to the modular design, all applications can be fulfilled with one instrument and the instrument can be tailored for your needs.

Results you can rely on

High-end imaging together with sophisticated analysis algorithms detect and analyze the contact angle and surface free energy precisely. The effect of roughness to wettability can be measured with the unique 3D Topography module.

Speed and repeatability

All steps from loading the measurement to performing it and analyzing the data can be automated. The need for time consuming preparations and cleaning are removed with the disposable liquid tips.

Applications

Optical tensiometers are used in a great variety of industries and research areas, such as chemicals, pharmaceuticals, electronics, foods, energy, paper and packaging. Attension Theta Flex can be used for convenient and precise studies of:

• Wettability
• Adhesion
• Homogeneity
• Surface roughness
• Spreading
• Cleanliness
• Printability
• Adsorption
• Emulsion and foam stability

Measurements

Attension Theta Flex can perform a complete range of measurements including:

• Static contact angle with the sessile drop, captive bubble and meniscus methods
• Dynamic contact angle with the tilted drop and sessile drop methods
• Surface free energy with the sessile drop, captive bubble and meniscus methods
• Surface- and interfacial tension with the pendant drop and reverse pendant drop methods
• Roughness-corrected contact angle and 3D surface roughness with the Fringe projection phase shifting method
• Interfacial dilatational rheology with the pulsating drop method

OneAttension software

OneAttension features an intuitive user interface, live analysis and configurable user groups and accounts. In-depth analysis of your results takes a few seconds and data can easily be exported.

Modules and accessories

Attension Theta Flex enables you to choose the level of automation and the advanced functionalities that you need for your applications. With the modular design and an extensive range of modules and accessories you have room to upgrade or change the instrument as your needs evolve.

Attension Theta Flex: one instrument for all your measurement needs.

For more information or to request a quote, please contact us.

• Simultaneous IR and Raman microscopy – IRaman
• Submicron IR spatial resolution
• Non-contact measurement

Successfully identifying contaminants is a critical step in ensuring that both product quality and yield are maintained during failure analysis. With ever stricter control standards and the shrinking size of high-tech products, confidently identifying smaller contaminants is becoming increasingly important. While high spatial resolution techniques exist for elemental and inorganic analysis, identification of organic contamination at the micron and submicron scale has been challenging.This webinar will discuss a new breakthrough in Optical Photothermal Infrared (O-PTIR) spectroscopy and its major benefits across a range of defect and failure analysis application areas, including semiconductors, displays, electronics, polymers, and other materials.In this webinar, attendees will learn about:

• Analyzing thin and small organic and inorganic contaminants in semicon/high-tech products
• Achieving ~40x improvement in submicron spatial resolution compared to traditional FTIR/QCL microscopy
• Working in-situ by examining surfaces on arbitrary substrates using a reflective non-contact (far-field) mode, while generating artifact-free, FTIR transmission-like spectra that are readily library searchable
• Performing simultaneous IR and Raman (IRaman) spectroscopy to provide complementary IR and Raman information that can be used for more thorough characterization of organic and inorganic contaminants

Dr. Mustafa Kansiz, Director of Product Management at Photothermal Spectroscopy Corp. and Dr. Dennis Walls, Technical Fellow at Dupont will host the webinar, with opportunities to ask questions during and after the webinar.The webinar will be recorded for later on-demand viewing.

The mIRage^® IR Microscope is an innovative new system, uniquely providing submicron IR spectroscopy and imaging across a wide variety of applications. Using Optical Photothermal IR (O-PTIR) spectroscopy, mIRage breaks the diffraction limit and bridges the gap between conventional IR microspectroscopy and nanoscale IR spectroscopy, and now, in a world first, provides IRaman, simultaneous IR and Raman measurements at the same time, from the same spot and the same resolution!

DATE AND TIME Wednesday 13th March, 11am-12pm PST(Los Angeles)/ 2-3pm EST(New York)

This exclusive quarterly newsletter highlights the latest product announcements, application specific solutions, and news about the company. Take a look inside the latest developments at Herzan and see if these new developments can complement your research! IN THIS ISSUE Stop By Booth 809 at the MRS Fall Meeting in Boston, MA Save Big On Herzan’s Most Popular Products During Fall Savings Program Featured Case Study: SEM Improves Stability Using Herzan’s AVI Platform

Herzan Happenings – Fall 2018 Edition

AVS 65 Lunch n Learn Complementary XPS TOF-SIMS

Physical Electronics User Reception

AVS 65 – Long Beach, CA

For the characterization of polymers and organic-coated surfaces, the combination of two surface sensitive techniques – X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) can be extremely powerful.  XPS provides quantitative analysis and short-range bonding chemistry from elements on the outermost surface while TOF-SIMS can provide the molecular information needed to positively identify organic species and the spatial resolution needed to show their lateral distributions on the sample surface.  This presentation will discuss the complementary attributes of XPS and TOF-SIMS and demonstrate how combining the two is essential to more fully understand organic surfaces.

We look forward to seeing you there!

Herzan is excited to announce it’s Summer Savings Program! This program allows researchers to save big on Herzan’s most popular products (up to 30%), including the TS Series active vibration isolation tables, WaveCatcher site survey tools, and AEK-2002 acoustic enclosures.

Don’t delay, start saving for your research today!

These promotions are available for a limited time: 9/30/2018. Click the links below to check out these exclusive offers!

July 24, 2018 (Santa Barbara, CA) Understanding and characterizing magnetic properties at the nanoscale is one of the key challenges in developing next-generation data storage and logic elements.  The new Variable Field Module (VFM4) accessory for Asylum Research MFP-3D Atomic Force Microscopes (AFMs) enables measurements under applied in-plane and out-of-plane magnetic fields in order to better understand their effects on nanoscale magnetic domain structure. The VFM4 is capable of applying either an adjustable in-plane (±8000 G ) or out-of-plane (±1200 G) magnetic field to a sample and offers ~1 G field resolution. Researchers can learn more about the VFM4 and see recent results at http://afm.oxinst.com/VFM4.

“This new combination of capabilities has allowed one customer at a national synchrotron facility to use AFM for research that was previously only possible with very costly and time-consuming scanning x-ray transmission microscopy (SXTM),” said Dr. Maarten Rutgers, Director of New Product Introduction. “No other AFM commercial solution offers the same capabilities, versatility, and ease of use for magnetics research. While the VFM has traditionally been used for magnetic force microscopy experiments, it can also be used with techniques like conductive AFM (CAFM) and on a wide range of diverse samples including piezoelectric and ferroelectric materials.”

The VFM4 easily attaches to most Asylum Research MFP-3D AFMs and includes replaceable pole tips to quickly adapt between in-plane and out-of-plane configurations. It maintains a steady magnetic field with rare-earth magnets that produce no heat, thermal drift, or mechanical vibration. For experiments where both an applied magnetic field and a high tip-sample voltage bias are required, there is an optional high-voltage kit to adapt the VFM4 for safe application of voltages up to ±220 Volts.

Image caption:  Magnetic skyrmions in Co-based thin film pads imaged with MFM under out-of-plane magnetic fields. Image courtesy of K. Bouzehouane, Unité Mixte de Physique CNRS, Thales, Univ. Paris-Sud, Université Paris-Saclay France.

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About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.  Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets.  Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.

About Oxford Instruments plc 

Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. Innovation has been the driving force behind Oxford Instruments’ growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.

The first technology business to be spun out from Oxford University, Oxford Instruments objective is to be the leading provider of new generation tools and systems for the research and industrial sectors with a focus on nanotechnology. Its key market sectors include nano-fabrication and nano-materials. The company’s strategy is to expand the business into the life sciences arena, where nanotechnology and biotechnology intersect.

This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments; Nuclear Magnetic Resonance; x-ray, electron, laser and optical based metrology; atomic force microscopy; optical imaging; advanced growth, deposition and etching.

Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.

For further information please Contact Us

September 13, 2018 11:30am-12:30pm EDT  (3:30-4:30pm UTC) This free webinar, held in conjunction with the Materials Research Society (MRS), provides an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. • Discover the latest AFM techniques to accurately map local photocurrent, work function, and other electrical response in photoactive materials and charge transport layers • See real-world results from leading researchers in the field on a variety of photovoltaic systems using standard and advanced AFM techniques • Learn how AFM has become simpler with turnkey instrumentation for better AFM optical experim Presenters Dr. Rajiv Giridharagopal, Ginger Lab, University of Washington–Seattle Rajiv Giridharagopal has been a Senior Research Scientist in Prof. David Ginger’s laboratory at the University of Washington–Seattle since 2015, with a research focus on SPM development for photovoltaic, bioelectronic, and related materials. He previously worked at the Intel Corporation in optical microscopy development. He earned a Ph.D. in Electrical Engineering from Rice University and holds two patents. Dr. F. Ted Limpoco, Oxford Instruments Asylum Research Ted Limpoco is an Applications Scientist at Oxford Instruments. He has over 10 years of AFM experience in nanoelectrical, nanomechanical, and nanotribology techniques. He was previously a postdoctoral fellow at the University of Illinois at Urbana-Champaign and has a Ph.D. in chemistry from the University of Florida.

Webinar Archives Cypher VRS Video-Rate AFM Graphene and 2D Materials Choosing the Best AFM Probe Analysis of Thin Films Characterization of Polymers Advanced PFM Introduction to PFM Cypher AFM blueDrive Photothermal Excitation Nanomechanical Mapping with Contact Resonance Getting Started with AFM and Biology Nanomechanical Mapping with AM-FM Mode Ultra-High Resolution Imaging wih Cypher AFMs Who Should Attend Academic and industrial researchers including: • Materials scientists, chemists, physicists, and electrical and chemical engineers involved in photovoltaic R&D • Scientists and engineers using microscopy, especially atomic force and scanning probe microscopy • Managers and instructors of multi-user characterization, microscopy, or nanotechnology centers

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