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Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM) for imaging the surface of a range of materials from metals to semiconductors to biological tissue, in some cases, to the atomic level. These instruments can also be used to characterize surface topography, surface chemistry and the nanomechanical properties of surfaces.
Below is a list of partners we work with in this field:
Showing all 6 results
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- Compact and robust atomic force microscope for stand alone and large stage operation
- Easy and quick cantilever exchange and alignment reduces downtime
- Automated batch measurements and scripting interface for system integration
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- Mounts on virtually every upright optical microscope or 3D optical profilometer
- Integrated motor for automated cantilever approach and engage
- Standard and extended AFM modes available through a modular controller
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- Compact and robust atomic force microscope for stand alone and large stage operation
- Easy and quick cantilever exchange and alignment reduces downtime
- Automated batch measurements and scripting interface for system integration
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All-in-one atomic force microscope for small samples and nanoeducation
- A robust and high-quality AFM product
- No setup needed: just plug in and go!
- Check out the NaioAFM video tutorials
- Options and accessories available
- Very competitive pricing: ask for a quote now!
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- Atomic resolution in minutes
- Extremely simple handling and reliable operation
- Controller and scan head integrated into a single device: just connect USB and power
- Starting at less than $10,000 USD
Showing all 6 results