Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis. View Discounted Products
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM) for imaging the surface of a range of materials from metals to semiconductors to biological tissue, in some cases, to the atomic level. These instruments can also be used to characterize surface topography, surface chemistry and the nanomechanical properties of surfaces.
Below is a list of partners we work with in this field:
No products were found matching your selection.