Microscopy

All-in-one atomic force microscope for small samples and nanoeducation

• Atomic resolution in minutes
• Extremely simple handling and reliable operation
• Controller and scan head integrated into a single device: just connect USB and power
• Starting at less than $10,000 USD

Market leading experience in FluidFM for AFM

• Highly accurate pressure, force, and position control with optical sample access
• Different FluidFM® probes: hollow cantilevers designed for specific applications
• Pioneering research within reach

The best solution for automated force mapping

• Straightforward experimental workflow: only a few steps from sample mounting to results
• One-click cantilever calibration: automatic cantilever deflection sensitivity and spring constant (Sader method) measurement
• Real-time data analysis: Young’s modulus, adhesion, and indentation are calculated and displayed during the measurement
• Facilitates measurements on demanding samples: experimental workflow repositions the sample for every measurement area

AFM systems fully tailored to your specifications

• Meeting to understan your requirements
• Nansosurf outlines solution
• joint discussion of solution,
• adaptation solution concept
• order based on concept