Surface Science

Introducing our advanced TEM Plasma Treatment System, a cost-effective solution optimized for plasma coatings, plasma etching, and surface activation. This fully automated system is designed for TEM sample holders, offering versatile compatibility, variable power control, and extended dwell time for precise and efficient cleaning. It includes low-power operation, a front-feed sample holder, multiple cleaning capabilities, re-entrant style compatibility, and dual gas inlets. Enjoy application-specific benefits, a user-friendly interface, and versatile adapters. Upgrade your electron microscopy with this cutting-edge plasma treatment system for streamlined, error-free cleaning and sample preparation.

• High performance portable fibre coupled Raman system
• High spatial resolution x/y <1 µm, z <2 µm
• Live white light sample viewing for accurate sample targeting
• Motorised x/y/z stack that enables accurate objective positioning for single point or mapping purposes
• Work with objective lens pointing downwards or horizontally

• Form deviation from 3D CAD models
• Calibration of surface texture measuring instruments
• Sub-micron height repeatability over entire extended area
• One shot height measurement up to 40 mm without Z scanning
• Bi-telecentric lenses with very low field distortion providing accurate metrology

Simply powerful

• Sample Navigation – An overview tool helps the user to inspect the sample during measurement preparation
• Auto 3D Function – the SensoSCAN software automatically
• Analysis & Reporting – It is also possible to create analysis templates
• Automating procedures module – Automated measurements are obtained using the Recipes tool
• Extended measurements module – Allows the user to easily define the measurement layout on the surface by means of the overview image

• Complete accessibility
• Cover a wide range of scales
• Maximum versatility
• A complete 3D measurement
• Measure angles greater than 90º
• Measurements without limitation
• Accurate and reliable

• Flexible. Powerful.
• 3D auto function
• Live image options
• Designed to be
• simple and easy to use
• It is time to play. . .
• uses premium CF60-2 Nikon objectives
• Obtain a clear and well-structured report
• Adaptable column – Flexible options are designed to avoid restrictions between samples with differing heights.

• Integrable metrology solutions
• Robust, rugged and reliable
• Versatile or fast
• Maximum measurement versatility
• Unprecedented high speed
• Compact, light and orientation agnostic

• Powerful Analysis Software
• 3D exportable in multiple formats
• Simple yet powerful, designed for you
• Smart calculations tool for key parameters
• The most perceptive visualization of your topographies
• Customizable reports for more flexible results presentations

• Easy to use
• Completely modularly adaptable to customer requirements
• Two levels (standard and premium) and several modules are available
• Digital Surf, is an extremely powerful tool for analysis nad reporting

Rapid Quality Control

• Guide tool for the QC manager
• Extremely fast
• Command line available
• Parameter statistical analysis module
• Exportable reports in multiple formats
• Automatized custom analysis solutions

The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

• CleanDrive: stable excitation in air and liquid
• Ultra low noise: below 15 fm/√Hz
• Direct drive: high-resolution imaging and large scan area
• Fully motorized system: full control via software

The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

• CleanDrive: stable excitation in air and liquid
• Ultra low noise: below 15 fm/√Hz
• Direct drive: high-resolution imaging and large scan area
• Fully motorized system: full control via software

• Modular concept to exactly match your needs
• Compatible with inverted microscopes
• Flat and linear scanning thanks to flexure-based scanner technology
• True flexibility with exchangeable cantilever holders for specialized tasks
• Scanning capabilities in liquid and advanced measurement modes
• Suitable for any sample size

• Compact and robust atomic force microscope for stand alone and large stage operation
• Easy and quick cantilever exchange and alignment reduces downtime
• Automated batch measurements and scripting interface for system integration

The tip-scanning AFM for heavy and large samples up to 300 mm

• Standard AFM system
•  300 mm x 300 mm sample stage
•  Ideal for samples up to 45 kg

• Mounts on virtually every upright optical microscope or 3D optical profilometer
• Integrated motor for automated cantilever approach and engage
• Standard and extended AFM modes available through a modular controller