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Introducing the Sensofar S neox Five Axis Complete 3D Measurement Solution
The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D optical profiler. This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric measurement.
This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric measurement. S neox 3D measurement technologies cover a wide range of scales, including
form (Ai Focus Variation), sub nanometric roughness (Interferometry) or critical dimensions that require high lateral resolution as well as vertical resolution (Confocal).
Key Features
The S neox Five Axis makes it possible to take automatic 3D surface measurements at defined positions, and combine them to create a complete 3D volumetric measurement.
S neox Five Axis is able to measure the sample at different positions of rotation and elevation (perspectives) generating a group of individual measurements. The SensoFIVE software merges all of the surfaces providing a sample surface with high accuracy by using the stacked image information of each single surface measurement. Merging different elevations, the system can provide shape and form information on sharp edges and/or critical surfaces.
Complete accessibility
Cover a wide range of scales
Maximum versatility
A complete 3D measurement
Measure angles greater than 90º
Measurements without limitation
Accurate and reliable
Key Benefits
Large Area 3D Optical Metrology System
Aerospace & Automotive
Forensics
Gears
Medical Devices
Micromanufacturing
Sharp Objects
Surface Finish
Tooling Industry
Watch Manufacturing
Trust the Experts at Spectra Research Corporation
Spectra Research Corporation (SRC) offers a range of innovative high-quality scientific products and laboratory services to industrial and scientific markets throughout Canada.
Specifications
System
Measuring principle
Confocal, PSI, ePSI, CSI, Ai Focus Variation and Thin Film
Observation types
Brightfield, Sequential Color RGB, Confocal, Interferential Phase Contrast
